Multiple Fault Diagnosis of Analog Circuits Based on Large Change Sensitivity Analysis

A new method is proposed in this paper for multiple fault diagnosis in linear analog circuits. The test equation in the traditional large change sensitivity method is modified to establish the linear relationship between the measurements and the faulty parameter deviations with the coefficient matrix derived from the nominal values of circuit parameters. By using a recently developed method to seek the ambiguity groups in the test equation, the faulty parameters with minimum number of solutions satisfying the test equation can be located. Exact parameter deviations are obtained from the test equation. An example circuit is provided to illustrate the proposed method